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TEST AND DIAGNOSIS FOR SMALL-DELAY DEFECTS
ISBN : 9781441982964
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Title of the books is TEST AND DIAGNOSIS FOR SMALL-DELAY DEFECTS . Author Name :TEHRANIPOOR, MOHAMMAD, PENG, KE, CH. Excellent book for the General Books, GENERAL. Published by SPRINGER. This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
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Title of the books is TEST AND DIAGNOSIS FOR SMALL-DELAY DEFECTS . Author Name :TEHRANIPOOR, MOHAMMAD, PENG, KE, CH. Excellent book for the General Books, GENERAL. Published by SPRINGER. This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
Specifications
| Author | TEHRANIPOOR, MOHAMMAD, PENG, KE, CH |
| Edition | LATEST EDITION |
| Year | 2011 |
| Publisher | SPRINGER NATURE GROUP |
| Binding | HARDCOVER |
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